Chen Z., Larbalestier D.C., Xie Y., Selvamanickam V., Chen Y., Xu A., Kametani F., Jaroszynski J.J., Viouchkov Y.L.
Ключевые слова: presentation, HTS, YBCO, coated conductors, current limiting characteristics, critical caracteristics, critical current density, grain boundaries, buffer layers, crack formation, microstructure, magnetic properties, irreversibility fields, angular dependence, MOCVD process, IBAD process, doping effect, Jc/B curves, pinning, defects, stacking fault, anisotropy, pinning force, experimental results
Ключевые слова: HTS, YBCO, films, fluorine-free process, MOD process, substrate sapphire, substrate single crystal, defects, stacking fault, pinning, co-evaporation process, critical caracteristics, Jc/B curves, angular dependence, critical current density, microstructure, fabrication, experimental results
Ключевые слова: HTS, YBCO, films, pinning, stacking fault, substrate SrTiO3, microstructure, Jc/B curves, substrate LaAlO3, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, coatings, films epitaxial, defects columnar, pinning, nanodots, PLD process, Jc/B curves, REBCO, angular dependence, RABITS process, stacking fault, IBAD process, comparison, fabrication, thickness dependence, nanoscaled effects, nanorods, pinning force, MOD process, presentation, critical caracteristics, substrate Hastelloy
Puig T., Obradors X., Plain J., Sandiumenge F.(felip@icmab.es), Rabier J., Proult A., Stretton I.
Ключевые слова: HTS, YBCO, bulk, pinning, strain effects, stacking fault, critical current density, temperature dependence, critical caracteristics
Takahashi K., Muroga T., Shiohara Y., Watanabe T., Kato T., Yamada Y., Hirayama T., Miyata S., Konishi M., Ibi A.
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